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Efficient test-point selection for scan-based BIST.
Huan-Chih Tsai
Kwang-Ting Cheng
Chih-Jen Lin
Sudipta Bhawmik
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (1998)
Keyphrases
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data sets
cost effective
real world
test data
real time
machine learning
learning algorithm
social networks
face recognition
optimal solution
search algorithm
evolutionary algorithm
lightweight
computationally expensive
statistical tests