Special issue on Advanced Machine Vision.

Steven Puttemans Toon Goedemé Ajmal Mian Thomas B. Moeslund Rikke Gade

Published in: Mach. Vis. Appl. (2020)

Keyphrases

machine vision
special issue
character recognition
image processing
vision system
ai edam
quality control
ecml pkdd
international journal
applied intelligence
imaging systems
special section
surface inspection
data analysis
advanced technologies
computer vision
real time