An FPGA-based test platform for analyzing data retention time distribution of DRAMs.
Chih-Sheng HouJin-Fu LiChih-Yen LoDing-Ming KwaiYung-Fa ChouCheng-Wen WuPublished in: VLSI-DAT (2013)
Keyphrases
- data sets
- data distribution
- data analysis
- database
- synthetic data
- data collection
- uniformly distributed
- data quality
- computer systems
- data processing
- image data
- probability distribution
- end users
- high quality
- databases
- data structure
- data points
- knowledge discovery
- small number
- data sources
- original data
- sensor data
- raw data
- search engine
- neural network
- data objects
- test data
- machine learning
- learning algorithm
- feature selection
- training data
- prior knowledge