A low-leakage current power 180-nm CMOS SRAM.
Tadayoshi EnomotoYuki HiguchiPublished in: ASP-DAC (2008)
Keyphrases
- leakage current
- low voltage
- power management
- power consumption
- cmos technology
- power line
- low power
- design considerations
- random access memory
- electrical properties
- power dissipation
- nm technology
- energy efficiency
- silicon on insulator
- silicon dioxide
- energy saving
- high speed
- energy consumption
- data management
- response time
- digital images