Breakdown investigation in GaN-based MIS-HEMT devices.

Fabio Alessio Marino Davide Bisi Matteo Meneghini Giovanni Verzellesi Enrico Zanoni Marleen Van Hove Shuzhen You Stefaan Decoutere Denis Marcon Steve Stoffels Nicolo Ronchi Gaudenzio Meneghesso

Published in: ESSDERC (2014)

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