Defect characterization of amorphous silicon thin film solar cell based on low frequency noise.
Linna HuLiang HeHua ChenXiaofei JiaYing HuHongmei MaDandan GuoYu QinPublished in: Sci. China Inf. Sci. (2018)
Keyphrases
- low frequency
- thin film
- solar cell
- high frequency
- frequency domain
- wavelet transform
- high density
- subband
- wavelet coefficients
- short circuit
- frequency band
- plasma etching
- discrete wavelet transform
- multi layer
- white light interferometry
- high frequency components
- chance discovery
- spatial domain
- fusion rules
- chemical vapor deposition
- low and high frequency
- high resolution
- multiscale
- knowledge discovery