Reliability of metamorphic HEMTs on GaAs substrates.

P. F. Marsh C. S. Whelan W. E. Hoke R. E. Leoni III T. E. Kazior

Published in: Microelectron. Reliab. (2002)

Keyphrases

room temperature
gallium arsenide
high density
thin film
reliability analysis
highly reliable
machine learning
genetic algorithm
clustering algorithm
database systems
artificial neural networks