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Dynamic variation monitor for measuring the impact of voltage droops on microprocessor clock frequency.

Keith A. BowmanCarlos TokunagaJames W. TschanzArijit RaychowdhuryMuhammad M. KhellahBibiche M. GeuskensShih-Lien LuPaolo A. AseronTanay KarnikVivek De
Published in: CICC (2010)
Keyphrases
  • duty cycle
  • real time
  • software engineering
  • high speed
  • graphical models
  • design methodology
  • high end
  • clock frequency