Full-IC manufacturability check based on dense silicon imaging.
Xiaolang YanZheng ShiYe ChenYue MaGensheng GaoPublished in: Sci. China Ser. F Inf. Sci. (2005)
Keyphrases
- liquid crystal
- imaging systems
- image analysis
- integrated circuit
- image processing
- low cost
- high resolution
- imaging devices
- high speed
- medical imaging
- clinical applications
- synthetic aperture
- electro optic
- silicon dioxide
- atomic force microscopy
- real time
- gallium arsenide
- stereo correspondence
- high dynamic range
- data acquisition
- computer vision
- neural network