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A Unified Interconnects Testing Scheme for 3D Integrated Circuits.
Chih-Yun Pai
Ruei-Ting Gu
Bo-Chuan Cheng
Liang-Bi Chen
Katherine Shu-Min Li
Published in:
Asian Test Symposium (2011)
Keyphrases
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integrated circuit
input output
printed circuit boards
detection scheme
electron beam
neural network
learning algorithm
low cost
test set
representation scheme