Investigation of Terrestrial Neutron Induced Failure Rates in Silicon Carbide JFET Based Cascode FETs.

L. Fursin P. Losee Akin Akturk

Published in: IRPS (2022)

Keyphrases

failure rate
storage capacity
occurrence probability
low cost
high density
random variables
bayesian networks
data sets
computational complexity
search space
test collection
point cloud
confidence intervals
lidar data