Blackbox Polynomial Identity Testing for Depth 3 Circuits.

Neeraj Kayal Shubhangi Saraf

Published in: Electron. Colloquium Comput. Complex. (2009)

Keyphrases

depth map
depth information
identity management
high speed
three dimensional
low order
depth estimation
software testing
depth images
statistical tests
test cases
expert systems
test data
high quality
face recognition
analog circuits
database
logic circuits
delay insensitive
logic synthesis
high level synthesis