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Polynomial Identity Testing for Depth 3 Circuits.
Neeraj Kayal
Nitin Saxena
Published in:
Comput. Complex. (2007)
Keyphrases
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depth map
depth information
test cases
depth images
databases
digital circuits
statistical tests
high resolution
information systems
real time
high speed
data mining
software testing
analog circuits
identity management
logic circuits
quantum computing