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A Probabilistic Measurement for Totally Self-Checking Circuits.
Jien-Chung Lo
Eiji Fujiwara
Published in:
DFT (1993)
Keyphrases
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probabilistic model
high speed
bayesian networks
analog vlsi
computer vision
generative model
context sensitive
image processing
fault diagnosis
information theoretic
uncertain data
probabilistic reasoning
circuit design
probabilistic interpretation
high level synthesis