An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits.

Hyung Ki Lee Dong S. Ha

Published in: VLSI Design (1994)

Keyphrases

pattern generator
built in self test
delay insensitive
high speed
analog vlsi
asynchronous circuits
circuit design
semi automatic
fault diagnosis
vlsi circuits
fully automatic
test cases
logic circuits
low power
power dissipation
cmos technology
low cost
integrated circuit
focal plane