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A low-cost configurability test strategy for an embedded analog circuit.
Agustin Laprovitta
Gabriela Peretti
Eduardo Romero
Samiha Mourad
Published in:
Microelectron. J. (2012)
Keyphrases
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low cost
analog circuits
embedded systems
neural network
test cases
fault diagnosis
wavelet packet transform
genetic algorithm
computer vision
multiscale
pattern recognition
digital circuits