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Shifted Leakage Power Characteristics of Dynamic Circuits Due to Gate Oxide Tunneling.

Zhiyu LiuVolkan Kursun
Published in: SoCC (2005)
Keyphrases
  • leakage current
  • power consumption
  • dynamic environments
  • dynamic characteristics
  • power dissipation
  • database
  • website
  • dynamically changing
  • low voltage
  • field effect transistors
  • logic synthesis
  • silicon dioxide