Study on Test Data Reduction Combining Illinois Scan and Bit Flipping.

Masayuki Arai Satoshi Fukumoto Kazuhiko Iwasaki

Published in: IEICE Trans. Inf. Syst. (2008)

Keyphrases

test data
training data
test set
test cases
data sets
training set
support vector machine
machine learning
computer vision
search algorithm
active learning