Modeling gate oxide short defects in CMOS minimum transistors.

Michel Renovell Jean Marc Gallière Florence Azaïs Yves Bertrand

Published in: ETW (2002)

Keyphrases

cmos technology
low power
power consumption
circuit design
field effect transistors
low cost
fuel cell
high speed
integrated circuit
metal oxide semiconductor
image sequences
parallel processing
modeling language
multiple input
low voltage
nm technology