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Accurate in situ measurement of peak noise and delay change induced by interconnect coupling.
Takashi Sato
Dennis Sylvester
Yu Cao
Chenming Hu
Published in:
IEEE J. Solid State Circuits (2001)
Keyphrases
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measurement error
noisy data
gaussian noise
high accuracy
high speed
computationally efficient
noise model
random noise
highly accurate
noise level
changing environment
noise free
weak signal detection
data sets
signal noise ratio
measurement model
power dissipation
steady state
image quality
multiscale
high quality