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Predictive Test Technique for Diagnosis of RF CMOS Receivers.
Kay Suenaga
Sebastià A. Bota
Rodrigo Picos
Eugeni Isern
Miquel Roca
Eugeni García-Moreno
Published in:
VTS (2009)
Keyphrases
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low cost
fault diagnosis
high speed
diagnostic tests
radio frequency
real time
diagnostic reasoning
power consumption
computer aided
model based reasoning
statistical significance
analog vlsi
circuit design
parallel processing
test cases
software development
relevance feedback