A Fast Voltage Clamp Circuit for the Accurate Measurement of the Dynamic ON-Resistance of Power Transistors.
Ratmir GelagaevPieter JacqmaerJohan DriesenPublished in: IEEE Trans. Ind. Electron. (2015)
Keyphrases
- power consumption
- clock gating
- duty cycle
- circuit design
- single phase
- low voltage
- power reduction
- power dissipation
- low power
- real time
- high quality
- high power
- field effect transistors
- short circuit
- metal oxide
- power losses
- cmos technology
- dynamic environments
- high speed
- high voltage
- power management
- low cost
- neural network