Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output.
Vedika SaravananSamah Mohamed SaeedPublished in: ETS (2021)
Keyphrases
- test data
- machine learning models
- logic circuits
- spam filtering
- machine learning approaches
- training data
- machine learning algorithms
- test cases
- test set
- training set
- data sets
- machine learning
- learning models
- predictive model
- semi supervised learning
- genetic algorithm
- text categorization
- database
- kernel methods
- decision trees
- training and test data