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Analysis of the effects of reflectance and refraction generated by wafers made from fused silica, ALOxNy and TiSixNy under different light sources on pattern length and best focus.

Yang-Kuao KuoChuen-Guang Chao
Published in: Microelectron. J. (2005)
Keyphrases
  • light source
  • single image
  • photometric stereo
  • shape from shading
  • multi view
  • object surface
  • reflectance properties
  • multiple light sources