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An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis.
Zeyun Zhao
Jia Wang
Qian Tao
Andong Li
Yiyang Chen
Published in:
Reliab. Eng. Syst. Saf. (2024)
Keyphrases
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incremental learning
defect detection
reliability analysis
textured surfaces
incremental learning algorithm
fuzzy artmap
learning process
supervised learning
automated visual inspection
batch mode
object oriented
semi supervised
batch learning
feature extraction
expert systems
fuzzy sets
metadata