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Process-induced charging damage in IGZO nTFTs.

Gaspard HiblotNouredine RassoulLieve TeugelsKatia DevriendtAdrian Vaisman ChasinMichiel van SettenAttilio BelmonteRomain DelhougneGouri Sankar Kar
Published in: IRPS (2021)
Keyphrases
  • neural network
  • decision making
  • e learning
  • expert systems
  • design process
  • process model