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Reversible nonvolatile and threshold switching characteristics in Cu/high-k/Si devices.

Chandreswar MahataWonwoo KimShiwhan KimMuhammad IsmailMin-Hwi KimSungjun KimByung-Gook Park
Published in: IEICE Electron. Express (2019)
Keyphrases
  • wide range
  • mobile devices
  • high precision
  • data sets
  • electron microscopy
  • threshold selection
  • database
  • databases
  • three dimensional
  • markov chain
  • cellular automata
  • thresholding algorithm