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Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET.

Xinyi ZhangKewei WangFang WangJiangjiang LiZhicheng WuDuoli LiBo LiJianhui BuZhengsheng Han
Published in: IRPS (2023)
Keyphrases
  • trade off
  • reliability analysis
  • factors influencing
  • factors that influence
  • real time
  • case study
  • image segmentation
  • information technology
  • failure rate
  • variance reduction
  • prior studies
  • multiple input