A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency.

Satoshi Ohtake Toshimitsu Masuzawa Hideo Fujiwara

Published in: J. Electron. Test. (2000)

Keyphrases

frequency domain
case study
real time
artificial intelligence
reinforcement learning
high efficiency
multi agent
denoising
binary images
computational efficiency
fault detection