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High reliability electron-ejection method for high density flash memories.
Takayuki Kawahara
Naoki Miyamoto
Syun-ichi Saeki
Yusuke Jyouno
Masataka Kato
Katsutaka Kimura
Published in:
IEEE J. Solid State Circuits (1995)
Keyphrases
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high precision
high reliability
high density
objective function
experimental evaluation
high accuracy
synthetic data
detection method
computational cost
cost function
data sets
clustering method
steady state
computational complexity
genetic algorithm
markov chain
data model