Post-silicon failing-test generation through evolutionary computation.
Ernesto SánchezGiovanni SquilleroAlberto Paolo TondaPublished in: VLSI-SoC (2011)
Keyphrases
- evolutionary computation
- test generation
- evolutionary algorithm
- genetic programming
- computational intelligence
- test cases
- machine learning and data mining
- design automation
- cooperative coevolution
- genetic algorithm
- fitness function
- static analysis
- fuzzy logic
- swarm intelligence
- evolutionary approaches
- evolutionary design
- quality assurance
- gene expression programming
- artificial life
- nature inspired algorithms
- software testing
- bio inspired
- machine learning
- control system
- optimal solution
- decision trees
- neural network