How image processing can push electron microscopy to its limits.
Dirk Van DyckMarc Op de BeeckPublished in: ICIP (3) (1995)
Keyphrases
- electron microscopy
- image processing
- low energy
- x ray
- image stacks
- image enhancement
- thin film
- medical imaging
- machine vision
- pattern recognition
- digital image processing
- image processing algorithms
- computer graphics
- signal processing
- denoising
- color images
- multiscale
- computer vision
- edge detection
- image denoising
- image segmentation
- image registration
- remote sensing
- low cost
- image analysis