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Evaluating application-aware soft error effects in digital circuits without fault injections or probabilistic computations.

K. ChibaniMichele PortolanRégis Leveugle
Published in: IOLTS (2016)
Keyphrases
  • digital circuits
  • generative model
  • bayesian networks
  • error rate
  • data sets
  • learning algorithm
  • database systems
  • probabilistic model
  • state space
  • belief networks
  • data flow