Login / Signup

Electromigration Avoidance in Analog Circuits: Two Methodologies for Current-Driven Routing.

Jens LienigGoeran JerkeThorsten Adler
Published in: VLSI Design (2002)
Keyphrases
  • analog circuits
  • fault diagnosis
  • data driven
  • current practice
  • real time
  • machine learning
  • genetic algorithm
  • artificial intelligence
  • control system