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A new repair scheme for TSV-based 3D memory using base die repair cells.
Donghyun Han
Hayoung Lee
Donghyun Kim
Sungho Kang
Published in:
ISOCC (2017)
Keyphrases
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damage assessment
preventive maintenance
database
information systems
learning algorithm
image sequences
computational complexity
scheduling problem
memory requirements
computational power
memory usage
failure rate
consistent query answering
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