Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.
Jan Arild TofteChee-Kian OngJiun-Lang HuangKwang-Ting (Tim) ChengPublished in: VTS (2000)
Keyphrases
- mixed signal
- pseudorandom
- low power
- multi channel
- vlsi circuits
- uniformly distributed
- random number
- low cost
- high speed
- power consumption
- random numbers
- digital circuits
- secret key
- cmos technology
- built in self test
- low voltage
- single chip
- analog to digital converter
- digital signal processing
- user specific
- computer vision