A Bayesian zero-failure reliability demonstration test of high quality electro-explosive devices.

Tsai-Hung Fan Chia-Chen Chang

Published in: Qual. Reliab. Eng. Int. (2009)

Keyphrases

high quality
failure rate
highly reliable
ground truth
artificial intelligence
high resolution
image quality
posterior probability
neural network
information systems
test cases
test data
bayesian inference
statistical significance
bayesian decision