Test scheduling for built-in self-tested embedded SRAMs with data retention faults.
Qiang XuBaosheng WangAndré IvanovFung Yu YoungPublished in: IET Comput. Digit. Tech. (2007)
Keyphrases
- data sets
- synthetic data
- data collection
- database
- missing data
- data points
- data sources
- xml documents
- raw data
- data quality
- test data
- data processing
- high quality
- training data
- original data
- noisy data
- data acquisition
- resource allocation
- spatial data
- historical data
- test cases
- software development
- sensor networks
- scheduling problem
- long term
- prior knowledge
- feature space
- data analysis
- data structure