On characterization of catastrophic faults in two-dimensional VLSI arrays.
Soumen MaityAmiya NayakBimal K. RoyPublished in: Integr. (2004)
Keyphrases
- three dimensional
- signal processing
- multi dimensional
- vlsi circuits
- fault diagnosis
- fault detection
- model based diagnosis
- axiomatic characterization
- vlsi architecture
- website
- vlsi design
- focal plane
- real world
- high speed
- pattern recognition
- low cost
- fuzzy logic
- vlsi implementation
- database systems
- feature selection
- linear array
- artificial intelligence
- fault detection and isolation
- data sets
- gel electrophoresis