Fast AFM Imaging Based on Compressive Sensing Using Undersampled Raster Scan.
Yixiang NiuGuoqiang HanPublished in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
- compressive sensing
- atomic force microscopy
- raster scan
- random projections
- sparse representation
- image sensor
- image representation
- hilbert curve
- connected components
- signal processing
- imaging systems
- image processing
- connected component labeling
- nearest neighbor
- image processing algorithms
- query processing
- object recognition
- multiscale