RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Kenji Suzuki
- Lifeng He
- Yuyan Chao
- Stefano Allegretti
- Lionel Lacassagne
- Min-Woong Seo
- David Stoppa
- Lorenzo Baraldi
- Eugenio Culurciello
- David A. Bader
- Matteo Perenzoni
- Wei Tang
- Shoji Kawahito
- Keiichiro Kagawa
- Keita Yasutomi
- Jian Zhang
- Shoushun Chen
- Bin Yao
- Siddharth Gupta
- Kazuaki Sawada
- Shuyue Guan
- Isao Horiba
- Danny Crookes
- Kiyoharu Aizawa
- Jinha Lee
- S. Sukhsawas
- Diana Palsetia
- Khaled Benkrid
- Nobuo Nakamura
- Frank Schumacher
- Thomas Greiner
- Nobukazu Teranishi
- Yukihiro Bandoh
- Xiao Zhao
- Zhexuan Song
- Arnaud Peizerat
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- SIGGRAPH
- ISSCC
- IEEE Access
- ICIP (1)
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- Pattern Recognit.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEICE Electron. Express
- IPTA
- Comput. Graph.
- Inf. Sci.
- ITCC
- ICCE
- IGARSS
- ISPA
- Digital Photography
- PICS
- ICIP
- IEICE Trans. Electron.
- J. Real Time Image Process.
- IEEE BigData
- Systems and Computers in Japan
- J. Signal Process. Syst.
- IEEE Trans. Biomed. Eng.
- Imaging Sensors and Systems
- IEEE Trans. Circuits Syst. Video Technol.
- ESSCIRC
- ICECS
- AIPR
- J. Parallel Distributed Comput.
- FPGA
- J. Syst. Archit.
- IEEE Trans. Computers
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