RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Yuyan Chao
- Lifeng He
- Kenji Suzuki
- Wei Tang
- Matteo Perenzoni
- David A. Bader
- Keiichiro Kagawa
- Shoji Kawahito
- Shoushun Chen
- Keita Yasutomi
- Jian Zhang
- Stefano Allegretti
- Min-Woong Seo
- Lionel Lacassagne
- Lorenzo Baraldi
- David Stoppa
- Eugenio Culurciello
- Rolf Lindner
- Lucio Pancheri
- Soumen Bag
- Yasuaki Kakehi
- Mithun Biswas
- C. Jinshong Hwang
- Rajiv Mehrotra
- Vikrant Khanna
- Michael A. Kriss
- Anuja Dixit
- Keiji Mabuchi
- Nagarajan Ranganathan
- Toon Goedemé
- Noboru Sugie
- Daniele Borghesani
- Evangelos Kosinas
- S. M. A. Sharif
- Stef Van Wolputte
- Tetsuo Yamada
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- ISSCC
- SIGGRAPH
- IEICE Electron. Express
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Pattern Recognit.
- IEEE Access
- IEEE Trans. Instrum. Meas.
- ICIP (1)
- IEEE Trans. Image Process.
- IEEE Trans. Circuits Syst. Video Technol.
- ESSCIRC
- ICECS
- AIPR
- Comput. Graph.
- Systems and Computers in Japan
- J. Signal Process. Syst.
- IEEE Trans. Biomed. Eng.
- Imaging Sensors and Systems
- IEEE BigData
- J. Real Time Image Process.
- IEICE Trans. Electron.
- Digital Photography
- PICS
- ICIP
- IGARSS
- ISPA
- ICCE
- IPTA
- Inf. Sci.
- ITCC
- Comput. Chem.
- Real Time Imaging
- IEEE Trans. Consumer Electron.
- Essen Symposium
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