RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Kenji Suzuki
- Lifeng He
- Yuyan Chao
- Eugenio Culurciello
- David A. Bader
- Matteo Perenzoni
- Jian Zhang
- Keita Yasutomi
- Stefano Allegretti
- Lorenzo Baraldi
- David Stoppa
- Lionel Lacassagne
- Wei Tang
- Shoji Kawahito
- Min-Woong Seo
- Keiichiro Kagawa
- Shoushun Chen
- Arnaud Peizerat
- Loukas Georgiadis
- Ankit Agrawal
- Wim Abbeloos
- Yasuaki Kakehi
- Yoshimasa Kawata
- Md. Mostofa Ali Patwary
- Joseph F. JáJá
- Michael A. Kriss
- S. M. A. Sharif
- Michele Benetti
- Danny Crookes
- Khaled Benkrid
- Oded Green
- Tetsuo Yamada
- Thomas Greiner
- Evangelos Kosinas
- Jinha Lee
- Nobukazu Teranishi
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- ISSCC
- SIGGRAPH
- ICIP (1)
- IEEE Access
- Pattern Recognit.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Image Process.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- Imaging Sensors and Systems
- J. Signal Process. Syst.
- IEEE BigData
- ESSCIRC
- Inf. Sci.
- IPTA
- PICS
- IEEE Trans. Circuits Syst. Video Technol.
- J. Real Time Image Process.
- ISPA
- ICIP
- ICECS
- Systems and Computers in Japan
- Comput. Graph.
- AIPR
- IEEE Trans. Biomed. Eng.
- Digital Photography
- IGARSS
- ITCC
- ICCE
- IEICE Trans. Electron.
- SPDP
- ICPRAI (2)
- FPL
- Frontiers Bioinform.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend