RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Kenji Suzuki
- Yuyan Chao
- Lifeng He
- Shoji Kawahito
- Min-Woong Seo
- David A. Bader
- Lionel Lacassagne
- Jian Zhang
- Eugenio Culurciello
- Lorenzo Baraldi
- Keiichiro Kagawa
- Stefano Allegretti
- Matteo Perenzoni
- Shoushun Chen
- Wei Tang
- David Stoppa
- Keita Yasutomi
- Kiyoharu Aizawa
- Rajiv Mehrotra
- Ankit Agrawal
- Siddharth Gupta
- Markus Holzer
- Yoshimasa Kawata
- Nobuo Nakamura
- Gilles Sicard
- Nobukazu Teranishi
- Stijn Helsen
- Anuja Dixit
- Zhexuan Song
- Takeshi Naemura
- Lucio Pancheri
- Alok N. Choudhary
- Thomas Greiner
- Diana Palsetia
- Mithun Biswas
- Rita Cucchiara
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- SIGGRAPH
- ISSCC
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- IEEE Access
- IEICE Electron. Express
- ICIP (1)
- IEEE Trans. Image Process.
- ICCE
- Imaging Sensors and Systems
- IEEE BigData
- ESSCIRC
- ISPA
- AIPR
- PICS
- Comput. Graph.
- ITCC
- ICIP
- J. Real Time Image Process.
- J. Signal Process. Syst.
- Systems and Computers in Japan
- IGARSS
- Digital Photography
- ICECS
- Inf. Sci.
- IEICE Trans. Electron.
- IEEE Trans. Biomed. Eng.
- IPTA
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Medical Imaging
- ICIP (2)
- Inf. Syst.
- ICDAR
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