RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Lifeng He
- Kenji Suzuki
- Yuyan Chao
- Jian Zhang
- Min-Woong Seo
- Wei Tang
- Shoushun Chen
- Keita Yasutomi
- Stefano Allegretti
- Lionel Lacassagne
- Eugenio Culurciello
- David Stoppa
- Matteo Perenzoni
- Keiichiro Kagawa
- Shoji Kawahito
- David A. Bader
- Lorenzo Baraldi
- Khaled Benkrid
- Antoine Dupret
- Jin Murayama
- Diana Palsetia
- Nobuo Nakamura
- Stef Van Wolputte
- Anderson Rocha
- Oded Green
- Michele Cancilla
- S. Sukhsawas
- Alok N. Choudhary
- C. Jinshong Hwang
- Michele Benetti
- Tetsuo Yamada
- Rajiv Mehrotra
- Kazuaki Sawada
- Nobukazu Teranishi
- Zhexuan Song
- Soumen Bag
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- ISSCC
- SIGGRAPH
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Image Process.
- ICIP (1)
- IEEE Access
- IEICE Electron. Express
- Pattern Recognit.
- IEEE Trans. Instrum. Meas.
- PICS
- ICCE
- IPTA
- AIPR
- IGARSS
- ESSCIRC
- IEEE Trans. Biomed. Eng.
- Systems and Computers in Japan
- Comput. Graph.
- Digital Photography
- ICECS
- IEEE Trans. Circuits Syst. Video Technol.
- J. Real Time Image Process.
- Imaging Sensors and Systems
- Inf. Sci.
- ISPA
- ITCC
- ICIP
- IEEE BigData
- J. Signal Process. Syst.
- J. Heuristics
- Pattern Recognit. Lett.
- PRIME
- J. Intell. Syst.
- Proc. ACM Manag. Data
Related Topics
Related Keywords
Popularity