RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Lifeng He
- Kenji Suzuki
- Yuyan Chao
- David Stoppa
- Lorenzo Baraldi
- Eugenio Culurciello
- Stefano Allegretti
- Lionel Lacassagne
- Min-Woong Seo
- Shoushun Chen
- Jian Zhang
- Keita Yasutomi
- Matteo Perenzoni
- David A. Bader
- Wei Tang
- Shoji Kawahito
- Keiichiro Kagawa
- Arnaud Peizerat
- Antoine Dupret
- Jin Murayama
- Markus Holzer
- Yoshimasa Kawata
- Wim Abbeloos
- Abdellatif Bey-Temsamani
- Giuseppe F. Italiano
- S. Subramaniam
- Alok N. Choudhary
- Murray H. Loew
- Md. Mostofa Ali Patwary
- Michele Benetti
- Ankit Agrawal
- Loukas Georgiadis
- Phalguni Gupta
- Kazuaki Sawada
- Bin Yao
- Siddharth Gupta
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- ISSCC
- SIGGRAPH
- IEICE Electron. Express
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Pattern Recognit.
- ICIP (1)
- IEEE Access
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- IEEE Trans. Circuits Syst. Video Technol.
- ESSCIRC
- ICECS
- AIPR
- Comput. Graph.
- Systems and Computers in Japan
- J. Signal Process. Syst.
- IEEE Trans. Biomed. Eng.
- Imaging Sensors and Systems
- J. Real Time Image Process.
- IEEE BigData
- IEICE Trans. Electron.
- Digital Photography
- PICS
- ICIP
- IGARSS
- ISPA
- ICCE
- IPTA
- Inf. Sci.
- ITCC
- Essen Symposium
- IEEE Trans. Very Large Scale Integr. Syst.
- Real Time Imaging
- IEEE Trans. Consumer Electron.
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