RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Lifeng He
- Yuyan Chao
- Kenji Suzuki
- Keiichiro Kagawa
- David A. Bader
- David Stoppa
- Shoushun Chen
- Wei Tang
- Matteo Perenzoni
- Min-Woong Seo
- Lorenzo Baraldi
- Keita Yasutomi
- Lionel Lacassagne
- Eugenio Culurciello
- Jian Zhang
- Shoji Kawahito
- Stefano Allegretti
- Xiao Zhao
- Jinha Lee
- S. Subramaniam
- Diana Palsetia
- Daniele Borghesani
- Michael A. Kriss
- Anuja Dixit
- Stef Van Wolputte
- Rolf Lindner
- Murray H. Loew
- Gilles Sicard
- Abdellatif Bey-Temsamani
- Markus Holzer
- Rita Cucchiara
- Nobuo Nakamura
- Yukihiro Bandoh
- Anderson Rocha
- Zhexuan Song
- Phalguni Gupta
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- SIGGRAPH
- ISSCC
- IEEE Access
- IEEE Trans. Image Process.
- Pattern Recognit.
- ICIP (1)
- IEEE Trans. Instrum. Meas.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEICE Electron. Express
- ICECS
- Comput. Graph.
- J. Signal Process. Syst.
- ICCE
- ICIP
- Systems and Computers in Japan
- IEEE Trans. Circuits Syst. Video Technol.
- IEICE Trans. Electron.
- J. Real Time Image Process.
- ISPA
- ITCC
- IEEE Trans. Biomed. Eng.
- IPTA
- Digital Photography
- IGARSS
- PICS
- ESSCIRC
- Imaging Sensors and Systems
- Inf. Sci.
- AIPR
- IEEE BigData
- ACSSC
- ICPP (3)
- Electron. J. Comb.
- ASP-DAC
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend