RASTER SCAN
Experts
- Costantino Grana
- Sei-ichiro Kamata
- Federico Bolelli
- Kenji Suzuki
- Lifeng He
- Yuyan Chao
- Stefano Allegretti
- Keita Yasutomi
- Jian Zhang
- Eugenio Culurciello
- Matteo Perenzoni
- David A. Bader
- David Stoppa
- Lorenzo Baraldi
- Shoji Kawahito
- Lionel Lacassagne
- Wei Tang
- Min-Woong Seo
- Shoushun Chen
- Keiichiro Kagawa
- Tetsuo Yamada
- Oded Green
- Khaled Benkrid
- Danny Crookes
- Jinha Lee
- Evangelos Kosinas
- Thomas Greiner
- Joseph F. JáJá
- Md. Mostofa Ali Patwary
- Yoshimasa Kawata
- Yasuaki Kakehi
- Wim Abbeloos
- Ankit Agrawal
- Arnaud Peizerat
- Loukas Georgiadis
- Michele Benetti
- S. M. A. Sharif
- Michael A. Kriss
- Nick Roussopoulos
Venues
- CoRR
- Sensors
- ICPR
- ISCAS
- IEEE J. Solid State Circuits
- SIGGRAPH
- ISSCC
- Pattern Recognit.
- IEEE Access
- ICIP (1)
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Image Process.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- PICS
- IPTA
- Inf. Sci.
- ESSCIRC
- IEEE BigData
- J. Signal Process. Syst.
- ICECS
- ICIP
- ISPA
- IEEE Trans. Circuits Syst. Video Technol.
- J. Real Time Image Process.
- Digital Photography
- AIPR
- IEEE Trans. Biomed. Eng.
- Comput. Graph.
- Systems and Computers in Japan
- Imaging Sensors and Systems
- ICCE
- IEICE Trans. Electron.
- ITCC
- IGARSS
- ACIVS
- IMSE
- RAMiCS
- Comput. Vis. Image Underst.
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