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Integration of partial scan and built-in self-test.

Chih-Jen LinYervant ZorianSudipta Bhawmik
Published in: J. Electron. Test. (1995)
Keyphrases
  • data integration
  • built in self test
  • real time
  • neural network
  • real world
  • information technology
  • data sets
  • information retrieval
  • genetic algorithm
  • video sequences
  • digital libraries
  • multiresolution
  • fully integrated