Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs.

Wang Liao Kojiro Ito Yukio Mitsuyama Masanori Hashimoto

Published in: IRPS (2020)

Keyphrases

low energy
electron microscopy
minimum energy
protein folding
coarse grained
fine grained
neural network
three dimensional
x ray
message passing