New test pattern generation units for NPSF oriented memory built-in self test.

A. Chrisanthopoulos Th. Haniotakis Y. Tsiatouhas Angela Arapoyanni

Published in: ICECS (2001)

Keyphrases

built in self test
low memory
memory size
memory requirements
memory space
website
real time
memory usage
genetic algorithm
three dimensional
integrated circuit
early vision
past experience
random access
computing power
computational power
associative memory
main memory
multiresolution
decision trees
data mining