Multiscale Convolution-Based Probabilistic Classification for Detecting Bare PCB Defects.
Lei LeiHan-Xiong LiHai-Dong YangPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- multiscale
- image processing
- classification accuracy
- decision trees
- pattern recognition
- classification scheme
- text classification
- support vector machine
- defect detection
- classification systems
- pattern classification
- classification method
- classification algorithm
- machine learning
- classification process
- automatic classification
- support vector machine svm
- data sets
- image analysis
- generative model
- machine vision
- feature extraction
- class labels
- learning algorithm
- uncertain data
- image segmentation
- classification rules
- bayesian networks
- probabilistic model
- image representation
- unsupervised learning
- model selection
- feature space
- scale space
- knn
- probability distribution