LE-MSFE-DDNet: a defect detection network based on low-light enhancement and multi-scale feature extraction.
Weihua HuTao WangYangsai WangZiyang ChenGuoheng HuangPublished in: Vis. Comput. (2022)
Keyphrases
- defect detection
- low light
- multiscale
- feature extraction
- image processing
- low light conditions
- motion blur
- visible spectrum
- noise level
- image enhancement
- local binary pattern
- edge detection
- wavelet transform
- scale space
- natural images
- coarse to fine
- image segmentation
- keypoints
- image fusion
- computer vision
- feature vectors
- face recognition
- wavelet coefficients
- image analysis