A New Approach to Threshold Voltage Measurements of Transistors.
Theodor HillebrandSteffen PaulDagmar Peters-DrolshagenPublished in: IOLTS (2018)
Keyphrases
- power system
- high density
- integrated circuit
- threshold selection
- measurement noise
- power consumption
- field effect transistors
- low voltage
- high voltage
- power supply
- low power
- transmission line
- artificial intelligence
- high power
- cmos technology
- circuit design
- electrical properties
- duty cycle
- electric field
- digital camera
- steady state
- artificial neural networks
- decision trees
- information systems