Flex-Pass-Gate SRAM Design for Static Noise Margin Enhancement Using FinFET-Based Technology.
Shin-ichi O'UchiMeishoku MasaharaKunihiro SakamotoKazuhiko EndoYongxun LiuTakashi MatsukawaToshihiro SekigawaHanpei KoikeEiichi SuzukiPublished in: CICC (2007)