A New Test Data Compression Scheme for Multi-scan Designs.
Teng LinJianhua FengYangyuan WangPublished in: ISVLSI (2007)
Keyphrases
- test data
- compression scheme
- image compression
- test cases
- data compression
- test set
- compression ratio
- training data
- compression algorithm
- run length encoding
- training set
- search based testing
- entropy coding
- data sets
- subband
- training samples
- image quality
- data points
- feature space
- image segmentation
- high compression ratio
- database