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Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.
Christoph Wilhelmer
Markus Jech
Dominic Waldhoer
Al-Moatasem Bellah El-Sayed
Lukas Cvitkovich
Tibor Grasser
Published in:
ESSDERC (2021)
Keyphrases
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si sio
metal oxide
statistical analysis
data analysis
image processing
network structure
neural network
multi dimensional
software systems
solid state