• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.

Christoph WilhelmerMarkus JechDominic WaldhoerAl-Moatasem Bellah El-SayedLukas CvitkovichTibor Grasser
Published in: ESSDERC (2021)
Keyphrases
  • si sio
  • metal oxide
  • statistical analysis
  • data analysis
  • image processing
  • network structure
  • neural network
  • multi dimensional
  • software systems
  • solid state